1. Crystal parameters

Laboratory frame: x primary beam, y horizontal, z vertical. At zero sample Euler angles (Ω, χ, Φ), the crystallographic a axis lies on +x, b in the xy-plane, and c completes a right-handed system.

2. Laue image

Upload a standard image, paste from the clipboard (/Ctrl+V), or load a NorthStar .hs2 or NeXus/HDF5 file (.nxs, .h5, .hdf5, .nexus).

Intensity curve

Drag control points; click to add; right-click to remove. Two points form a line; additional points use smooth splines. End segments extend linearly.

Fix datafile convention on load

Apply when the raw array is stored in a different row/column order.

Data corrections

Radial normalization divides each pixel by the azimuthal mean at its distance from the beam center (linear interpolation between bins). The intensity scale is re-scaled automatically when this correction is enabled.

3. Instrument
4. Sample orientation

Predicted peak overlay

5. Peak detection & matching

Detected peak overlay

6. Orientation refinement

Local least-squares fit from the current approximate orientation. Add or auto-detect peaks (they index automatically), then refine sample/detector parameters.

Ideal orientation calculator

Enter the HKL you placed on the direct beam (lab +x) and a second reflection that should lie in the plane perpendicular to the beam (not the detector x axis). Defaults 0 0 1 and 1 0 0 are for a cubic crystal after “Align to beam” on 0 0 1.

Predicted reflections

hkl |G| x y