Laue analysis
Index x-ray and neutron Laue patterns from area-detector images. Import crystal parameters from a CIF or manual entry, load detector images (PNG, NorthStar .hs2, or NeXus/HDF5), overlay predicted reflections, auto-detect peaks, and refine orientation.
Disclaimer: These tools are experimental and may still have bugs/errors. If you spot one, please tell me!
1. Crystal parameters
Laboratory frame: x primary beam, y horizontal, z vertical. At zero sample Euler angles (Ω, χ, Φ), the crystallographic a axis lies on +x, b in the xy-plane, and c completes a right-handed system.
2. Laue image
Upload a standard image, paste from the clipboard (⌘/Ctrl+V),
or load a NorthStar .hs2 or NeXus/HDF5 file (.nxs, .h5, .hdf5, .nexus).
Intensity curve
Drag control points; click to add; right-click to remove. Two points form a line; additional points use smooth splines. End segments extend linearly.
Fix datafile convention on load
Apply when the raw array is stored in a different row/column order.
Data corrections
Radial normalization divides each pixel by the azimuthal mean at its distance from the beam center (linear interpolation between bins). The intensity scale is re-scaled automatically when this correction is enabled.
3. Instrument
4. Sample orientation
Predicted peak overlay
5. Peak detection & matching
Detected peak overlay
6. Orientation refinement
Local least-squares fit from the current approximate orientation. Add or auto-detect peaks (they index automatically), then refine sample/detector parameters.
Ideal orientation calculator
Enter the HKL you placed on the direct beam (lab +x) and a second reflection that should lie in the plane perpendicular to the beam (not the detector x axis). Defaults 0 0 1 and 1 0 0 are for a cubic crystal after “Align to beam” on 0 0 1.
Predicted reflections
| hkl | |G| | x | y |
|---|