1. Crystal parameters

Laboratory frame: x primary beam, y horizontal, z vertical. At zero sample Euler angles (Ω, χ, Φ), the crystallographic a axis lies on +x, b in the xy-plane, and c completes a right-handed system.

2. Laue image

Upload a standard image, paste from the clipboard (⌘/Ctrl+V), or load a NorthStar .hs2 or NeXus/HDF5 file (.nxs, .h5, .hdf5, .nexus). With no image loaded, the simulated pattern is drawn on a blank detector.

Intensity curve

Drag control points; click to add; right-click to remove. Two points form a line; additional points use smooth splines. End segments extend linearly.

Fix datafile convention on load

Apply when the raw array is stored in a different row/column order.

Data corrections

Radial normalization divides each pixel by the azimuthal mean at its distance from the beam center (linear interpolation between bins). The intensity scale is re-scaled automatically when this correction is enabled.

3. Instrument
4. Sample orientation

Predicted peak overlay

5. Peak detection & matching

Detected peak overlay

6. Orientation refinement

Local fit from the current approximate orientation. Add or auto-detect well-separated spots and check their index labels first. Index assignments stay fixed during the fit. Start with sample angles; add detector parameters only when enough spots constrain them.

Residuals larger than the tolerance receive less weight. This helps with isolated bad matches; it does not replace correct indexing. Reported RMS is the 2D distance between observed and predicted spots.

Ideal orientation calculator

Enter the reciprocal direction (HKL) placed along the direct beam (lab +x), and a nonparallel peak that should lie in the same horizontal scattering plane as the beam (lab x–y, with vertical component z = 0). The two HKLs need not be perpendicular. Either horizontal side is accepted; the smaller correction is reported. These lab axes are independent of detector tilt and image flips.

Predicted reflections

hkl |G| x y